IEEE transactions on nuclear science, 2010-12, Vol.57 (6), p.3419-3425
2010
Volltextzugriff (PDF)
Details
- Autor(en) / Beteiligte
- Titel
- Evaluation of an Accelerated ELDRS Test Using Molecular Hydrogen
- Ist Teil von
- IEEE transactions on nuclear science, 2010-12, Vol.57 (6), p.3419-3425
- Ort / Verlag
- New York: IEEE
- Erscheinungsjahr
- 2010
- Quelle
- IEEE/IET Electronic Library (IEL)
- Beschreibungen/Notizen
- An accelerated total ionizing dose (TID) hardness assurance test for enhanced low dose rate sensitive (ELDRS) bipolar linear circuits, using high dose rate tests on parts that have been exposed to molecular hydrogen, has been proposed and demonstrated on several ELDRS part types. In this study several radiation-hardened "ELDRS-free" part types have been tested using this same approach to see if the test is overly conservative.
- Sprache
- Englisch
- Identifikatoren
- ISSN: 0018-9499eISSN: 1558-1578DOI: 10.1109/TNS.2010.2070806Titel-ID: cdi_proquest_journals_1069254921
- Format
- –
- Schlagworte
- Accelerated tests, Assurance, Bipolar linear circuits, Bipolar transistors, Degradation, discrete bipolar transistors, Dosage, dose rate, enhanced low-dose-rate sensitivity (ELDRS), Exposure, Hardness, hydrogen, Life estimation, Linear circuits, Radiation effects, Sensitivity, total ionizing dose