Thin solid films, 1998, Vol.319 (1-2)
1998
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Details
- Autor(en) / Beteiligte
- Titel
- 1997 ICAM/E-MRS Spring Conference, Symposium C: Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Films Structures
- Ist Teil von
- Thin solid films, 1998, Vol.319 (1-2)
- Ort / Verlag
- Lausanne: Elsevier Science
- Erscheinungsjahr
- 1998
- Quelle
- Elsevier Journal Backfiles on ScienceDirect (DFG Nationallizenzen)
- Sprache
- Englisch
- Identifikatoren
- ISSN: 0040-6090eISSN: 1879-2731Titel-ID: cdi_pascalfrancis_primary_417864
- Format
- –
- Schlagworte
- Condensed matter: structure, mechanical and thermal properties, Electron, ion, and scanning probe microscopy, Exact sciences and technology, Low-dimensional structures (superlattices, quantum well structures, multilayers): structure, and nonelectronic properties, Physics, Structure and morphology, thickness, Structure of solids and liquids, crystallography, Surfaces and interfaces, thin films and whiskers (structure and nonelectronic properties), Thin film structure and morphology, X-ray diffraction and scattering