Ferroelectrics, 2010-01, Vol.402 (1), p.43-46
2010
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Details
- Autor(en) / Beteiligte
- Titel
- Interface Modifications of Lead Zirconate Titanate Thin Films
- Ist Teil von
- Ferroelectrics, 2010-01, Vol.402 (1), p.43-46
- Ort / Verlag
- Colchester: Taylor & Francis Group
- Erscheinungsjahr
- 2010
- Quelle
- Taylor & Francis Journals Auto-Holdings Collection
- Beschreibungen/Notizen
- Electrical properties of ferroelectric thin films depend on the quality of not only the ferroelectric thin layer but also the ferroelectric/electrode interfaces. In the present study, attempts were made to minimize the Pb depletion at the bottom electrode/ferroelectric interface in lead zirconate titanate ferroelectric thin films by adding a PbO interfacial layer using a chemical solution deposition method. The crystallographic structure of the PZT thin films with and without PbO layer were examined by X-ray diffraction. The microstructure of the thin film samples was characterized using optical microscope and atomic force microscope.
- Sprache
- Englisch
- Identifikatoren
- ISSN: 0015-0193eISSN: 1563-5112DOI: 10.1080/00150191003697328Titel-ID: cdi_pascalfrancis_primary_23734115
- Format
- –
- Schlagworte
- Condensed matter: electronic structure, electrical, magnetic, and optical properties, Condensed matter: structure, mechanical and thermal properties, Crystal structure, Crystallography, Deposition, Dielectric thin films, Dielectrics, piezoelectrics, and ferroelectrics and their properties, Diffraction, Electric properties, Electrical properties, Electrodes, Exact sciences and technology, Ferroelectric materials, Ferroelectrics, interfaces, Lead, Lead (metal), Lead zirconate titanates, Microstructure, modification, Physics, PZT thin films, Structure and morphology, thickness, Studies, Surfaces and interfaces, thin films and whiskers (structure and nonelectronic properties), Thin film structure and morphology, Thin films