Details

Autor(en) / Beteiligte

• Su, C.C.
• Chang, C.S.
• Huang, H.W.
• Tu, D.S.
• Lee, C.L.
• Lin, J.C.H.

Titel

Dynamic analog testing via ATE digital test channels

Ist Teil von

• 13th Asian Test Symposium, 2004, p.308-312

Ort / Verlag

Los Alamitos CA: IEEE

Erscheinungsjahr

2004

Quelle

IEEE Xplore

Beschreibungen/Notizen

• A dynamic analog test methodology using digital tester is proposed. A simple triangular waveform is built on the device interface board for the stimulus generation. The response waveform is quantized by the dual comparators in a digital pin electronic circuit. Statistical analysis is conducted to enhance the quantization resolution and minimize the noise effect. The experimental results using an ATE show that the error is less than 2%. It confirms the feasibility of the proposed methodology.