Journal of adhesion science and technology, 2005-01, Vol.19 (3-5), p.291-311
2005
Volltextzugriff (PDF)
Details
- Autor(en) / Beteiligte
- Titel
- Accounting for the JKR-DMT transition in adhesion and friction measurements with atomic force microscopy
- Ist Teil von
- Journal of adhesion science and technology, 2005-01, Vol.19 (3-5), p.291-311
- Ort / Verlag
- Leiden: Taylor & Francis Group
- Erscheinungsjahr
- 2005
- Quelle
- Taylor & Francis Journals Auto-Holdings Collection
- Beschreibungen/Notizen
- Over the last 15 years, researchers have applied theories of continuum contact mechanics to nanotribology measurements to determine fundamental parameters and processes at play in nanometer-scale contacts. In this paper we discuss work using the atomic force microscope to determine nanoscale adhesion and friction properties between solids. Our focus is on the role that continuum contact mechanics plays in analyzing these measurements. In particular, we show how the JKR-to-DMT transition is taken into account, as well as limitations involved in using these models of contact in the presence of adhesion.
- Sprache
- Englisch
- Identifikatoren
- ISSN: 0169-4243eISSN: 1568-5616DOI: 10.1163/1568561054352685Titel-ID: cdi_pascalfrancis_primary_17013851
- Format
- –
- Schlagworte
- ADHESION, ATOMIC FORCE MICROSCOPY (AFM), Condensed matter: structure, mechanical and thermal properties, CONTACT MECHANICS, Exact sciences and technology, FRICTION, Fundamental areas of phenomenology (including applications), Mechanical and acoustical properties, adhesion, Mechanical contact (friction...), NANOTRIBOLOGY, Physics, Solid mechanics, Solid surfaces and solid-solid interfaces, Structural and continuum mechanics, Surfaces and interfaces, thin films and whiskers (structure and nonelectronic properties)