Details

Autor(en) / Beteiligte

• Lau, J.W.
• Zhu, Y.
• Morrow, P.
• Read, J.C.
• Hoink
• V.
• Egelhoff, W.F.
• Huang, L.

Titel

In situ Measurments in a Transmission Electron Microscopy on Nanomagnetic Tunnel Junctions

Ist Teil von

• Applied physics letters, 2010-06, Vol.96 (26)

Ort / Verlag

United States

Erscheinungsjahr

2010

Quelle

American Institute of Physics

Beschreibungen/Notizen

• We showed that a chain of nanomagnetic tunnel junctions (MTJs) devices can be electrically addressed individually, in situ, in a transmission electron microscope, such that transport properties can be in principle, quantitatively correlated with each device's defects and microstructure. A unique energy barrier was obtained for each device measured. Additionally, in situ tunneling magnetoresistance (TMR) measurements were obtained for a subset of devices. We found that TMR values for our nano-MTJs were generally smaller than TMR in the unpatterned film.