Details

Autor(en) / Beteiligte

• Thompson, M C
• Badakov, H
• Cook, A M
• Rosenzweig, J B
• Tikhoplav, R
• Travish, G
• Blumenfeld, I
• Hogan, M J
• Ischebeck, R
• Kirby, N
• Siemann, R
• Walz, D
• Muggli, P
• Scott, A
• Yoder, R B

Titel

Breakdown limits on Gigavolt-per-meter electron-beam-driven wakefields in dielectric structures

Ist Teil von

• Physical review letters, 2008-05, Vol.100 (21), p.214801-214801, Article 214801

Ort / Verlag

United States

Erscheinungsjahr

2008

Link zum Volltext

Quelle

American Physical Society Journals

Beschreibungen/Notizen

• First measurements of the breakdown threshold in a dielectric subjected to GV/m wakefields produced by short (30-330 fs), 28.5 GeV electron bunches have been made. Fused silica tubes of 100 microm inner diameter were exposed to a range of bunch lengths, allowing surface dielectric fields up to 27 GV/m to be generated. The onset of breakdown, detected through light emission from the tube ends, is observed to occur when the peak electric field at the dielectric surface reaches 13.8+/-0.7 GV/m. The correlation of structure damage to beam-induced breakdown is established using an array of postexposure inspection techniques.