Applied physics letters, 1976-02, Vol.28 (4), p.237-239
1976
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Details
- Autor(en) / Beteiligte
- Titel
- Oxygen distribution in sputtered Nb-Ge films
- Ist Teil von
- Applied physics letters, 1976-02, Vol.28 (4), p.237-239
- Ort / Verlag
- United States: American Institute of Physics (AIP)
- Erscheinungsjahr
- 1976
- Quelle
- Alma/SFX Local Collection
- Beschreibungen/Notizen
- A quantiative determination of the distribution of oxygen in a high-Tc (22 K) Nb-Ge film has been made using a nuclear backscattering method. The Nb/Ge ratios as a function of depth have also been determined. An apparent correlation between oxygen concentration and Nb/Ge ratio is observed.
- Sprache
- Englisch
- Identifikatoren
- ISSN: 0003-6951eISSN: 1077-3118DOI: 10.1063/1.88711Titel-ID: cdi_osti_scitechconnect_4087390
- Format
- –
- Schlagworte
- 360104 -Materials-Metals & Alloys-Physical Properties, BACKSCATTERING, CHEMICAL PREPARATION, GERMANIUM ALLOYS- CHEMICAL COMPOSITION, N40130 -Chemistry-Analytical & Separations Chemistry-Radiometric & Radiochemical Procedures, N50230 -Metals, Ceramics, & Other Materials-Metals & Alloys-Properties, Structure & Phase Studies, N66200 -Physics (Low Temperature)-Superconductivity, NIOBIUM BASE ALLOYS- CHEMICAL COMPOSITION, OXYGEN ADDITIONS, OXYGEN- RADIATION SCATTERING ANALYSIS, SPUTTERING, SUPERCONDUCTIVITY, TRANSITION TEMPERATURE, TYPE-II SUPERCONDUCTORS