Details

Autor(en) / Beteiligte

• Faenov, A. Ya
• Pikuz, T. A.
• Fukuda, Y.
• Kando, M.
• Kotaki, H.
• Homma, T.
• Kawase, K.
• Kameshima, T.
• Pirozhkov, A.
• Yogo, A.
• Tampo, M.
• Mori, M.
• Sakaki, H.
• Hayashi, Y.
• Nakamura, T.
• Pikuz, S. A.
• Skobelev, I. Yu
• Gasilov, S. V.
• Giulietti, A.
• Cecchetti, C. A.
• Boldarev, A. S.
• Gasilov, V. A.
• Magunov, A.
• Kar, S.
• Borghesi, M.
• Bolton, P.
• Daido, H.
• Tajima, T.
• Kato, Y.
• Bulanov, S. V.

Titel

Submicron ionography of nanostructures using a femtosecond-laser-driven-cluster-based source

Ist Teil von

• Applied physics letters, 2009-09, Vol.95 (10), p.101107-101107-3

Ort / Verlag

United States: American Institute of Physics

Erscheinungsjahr

2009

Quelle

American Institute of Physics

Beschreibungen/Notizen

• An intense isotropic source of multicharged carbon and oxygen ions with energy above 300 keV and particle number > 10 8 per shot was obtained by femtosecond Ti:Sa laser irradiation of submicron clusters. The source was employed for high-contrast contact ionography images with 600 nm spatial resolution. A variation in object thickness of 100 nm was well resolved for both Zr and polymer foils.