Details

Autor(en) / Beteiligte

• Zhang, Jin
• Hu, Jun
• Jiang, Zhisen
• Zhang, Kai
• Liu, Peng
• Wang, Chaonan
• Yuan, Qingxi
• Pianetta, Piero
• Liu, Yijin

Titel

Automatic 3D image registration for nano‐resolution chemical mapping using synchrotron spectro‐tomography

Ist Teil von

• Journal of synchrotron radiation, 2021-01, Vol.28 (1), p.278-282

Ort / Verlag

5 Abbey Square, Chester, Cheshire CH1 2HU, England: International Union of Crystallography

Erscheinungsjahr

2021

Quelle

Wiley Online Library - AutoHoldings Journals

Beschreibungen/Notizen

• Nano‐resolution synchrotron X‐ray spectro‐tomography has been demonstrated as a powerful tool for probing the three‐dimensional (3D) structural and chemical heterogeneity of a sample. By reconstructing a number of tomographic data sets recorded at different X‐ray energy levels, the energy‐dependent intensity variation in every given voxel fingerprints the corresponding local chemistry. The resolution and accuracy of this method, however, could be jeopardized by non‐ideal experimental conditions, e.g. instability in the hardware system and/or in the sample itself. Herein is presented one such case, in which unanticipated sample deformation severely degrades the data quality. To address this issue, an automatic 3D image registration method is implemented to evaluate and correct this effect. The method allows the redox heterogeneity in partially delithiated LixTa0.3Mn0.4O2 battery cathode particles to be revealed with significantly improved fidelity. An automatic 3D image registration method is implemented for correcting unanticipated sample deformation during nano‐resolution spectro‐tomography experiments. This method significantly improves the quality of the spatially resolved XANES spectra, which fingerprints the local chemistry.