Details

Autor(en) / Beteiligte

• Azuma, Keisuke
• Togari, Akihiro
• Zhou, Qilai
• Hatano, Yuji
• Yoshida, Naoaki
• Shimada, Masashi
• Taylor, Chase N.
• Buchenauer, Dean
• Kolasinski, Robert
• Chikada, Takumi
• Oya, Yasuhisa

Titel

Effect of C-He simultaneous implantation on deuterium retention in damaged W by Fe implantation

Ist Teil von

• Fusion engineering and design, 2018-12, Vol.137 (C), p.10-14

Ort / Verlag

Amsterdam: Elsevier B.V

Erscheinungsjahr

2018

Quelle

Elsevier ScienceDirect Journals

Beschreibungen/Notizen

• Deuterium (D) retention behaviors for the 3 keV Helium (He+) implanted damaged-Tungsten (W) and 10 keV Carbon (C+) - 3 keV He+ simultaneous implanted damaged-W were evaluated by thermal desorption spectroscopy (TDS) to understand the synergetic effect of defect formation and C/He existence on D retention behavior for W with various damage level. For the He+ implantation, the retention of D trapped by dislocation loops was controlled by 3 keV He+ fluence. The D retention in the deeper region was reduced by He+ implantation with higher He+ fluence due to the formation of He bubbles and dense defects at the surface region which would reduce the effective D diffusion coefficient. In addition, in the case of the simultaneous C+ - He+ implantation, the reduction of D retention trapped in the deeper region was also found by the higher C+ - He+ fluence. It can be said that D retention behavior was controlled by the formation of He induced defects and accumulation of He near the surface even if the damages were introduced in the deeper region.