Details

Autor(en) / Beteiligte

• Goldberg, Kenneth A.
• Bryant, Diane
• Wojdyla, Antoine
• Helmbrecht, Michael
• Gullikson, Eric

Titel

Reflective binary amplitude grating for soft x-ray shearing and Hartmann wavefront sensing

Ist Teil von

• Optics letters, 2020-09, Vol.45 (17), p.4694-4697

Ort / Verlag

Washington: Optical Society of America

Erscheinungsjahr

2020

Quelle

Optica Publishing Group Journals (Optical Society)

Beschreibungen/Notizen

• We demonstrate a reflective wavefront sensor grating suitable for the characterization of high-quality x-ray beamlines and optical systems with high power densities. Operating at glancing incidence angles, the optical element is deeply etched with a two-level pattern of shearing interferometry gratings and Hartmann wavefront sensor grids. Transverse features block unwanted light, enabling binary amplitude in reflection with high pattern contrast. We present surface characterization and soft x-ray reflectometry of a prototype grating array to demonstrate function prior to wavefront measurement applications. A simulation of device performance is shown.