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Reflective binary amplitude grating for soft x-ray shearing and Hartmann wavefront sensing
Ist Teil von
Optics letters, 2020-09, Vol.45 (17), p.4694-4697
Ort / Verlag
Washington: Optical Society of America
Erscheinungsjahr
2020
Quelle
Optica Publishing Group Journals (Optical Society)
Beschreibungen/Notizen
We demonstrate a reflective wavefront sensor grating suitable for the characterization of high-quality x-ray beamlines and optical systems with high power densities. Operating at glancing incidence angles, the optical element is deeply etched with a two-level pattern of shearing interferometry gratings and Hartmann wavefront sensor grids. Transverse features block unwanted light, enabling binary amplitude in reflection with high pattern contrast. We present surface characterization and soft x-ray reflectometry of a prototype grating array to demonstrate function prior to wavefront measurement applications. A simulation of device performance is shown.