Details

Autor(en) / Beteiligte

• Balbi, G.
• Barbero, M.
• Beccherle, R.
• Bindi, M.
• Breugnon, P.
• Butti, P.
• Cinca, D.
• Dickinson, J.
• Ferrere, D.
• Fougeron, D.
• Garcia-Sciveres, M.
• Pascual, J. Garcia
• Gaudiello, A.
• Gemme, C.
• Giangiacomi, N.
• Hemperek, T.
• Jeanty, L.
• Kepka, O.
• Kocian, M.
• Lantzsch, K.
• Liu, P.
• Martin, C.
• Mekkaoui, A.
• Menouni, M.
• Potamianos, K.
• Rozanov, A.
• Takubo, Y.
• Wensing, M.

Titel

Measurements of Single Event Upset in ATLAS IBL

Ist Teil von

• Journal of instrumentation, 2020-06, Vol.15 (6), p.P06023-P06023

Ort / Verlag

Bristol: IOP Publishing

Erscheinungsjahr

2020

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• Effects of Single Event Upsets (SEU) and Single Event Transients (SET) are studied in the FE-I4B chip of the innermost layer of the ATLAS pixel system. SEU/SET affect the FE-I4B Global Registers as well as the settings for the individual pixels, causing, among other things, occupancy losses, drops in the low voltage currents, noisy pixels, and silent pixels. Quantitative data analysis and simulations indicate that SET dominate over SEU on the load line of the memory. Operational issues and mitigation techniques are presented.