Sie befinden Sich nicht im Netzwerk der Universität Paderborn. Der Zugriff auf elektronische Ressourcen ist gegebenenfalls nur via VPN oder Shibboleth (DFN-AAI) möglich. mehr Informationen...
Ergebnis 20 von 3120

Details

Autor(en) / Beteiligte
Titel
High Precision Detection of Change in Intermediate Range Order of Amorphous Zirconia-Doped Tantala Thin Films Due to Annealing
Ist Teil von
  • Physical review letters, 2019-07, Vol.123 (4), p.045501-045501, Article 045501
Ort / Verlag
United States: American Physical Society
Erscheinungsjahr
2019
Link zum Volltext
Quelle
APS_美国物理学会过刊
Beschreibungen/Notizen
  • Understanding the local atomic order in amorphous thin film coatings and how it relates to macroscopic performance factors, such as mechanical loss, provides an important path towards enabling the accelerated discovery and development of improved coatings. High precision x-ray scattering measurements of thin films of amorphous zirconia-doped tantala (ZrO_{2}-Ta_{2}O_{5}) show systematic changes in intermediate range order (IRO) as a function of postdeposition heat treatment (annealing). Atomic modeling captures and explains these changes, and shows that the material has building blocks of metal-centered polyhedra and the effect of annealing is to alter the connections between the polyhedra. The observed changes in IRO are associated with a shift in the ratio of corner-sharing to edge-sharing polyhedra. These changes correlate with changes in mechanical loss upon annealing, and suggest that the mechanical loss can be reduced by developing a material with a designed ratio of corner-sharing to edge-sharing polyhedra.
Sprache
Englisch
Identifikatoren
ISSN: 0031-9007
eISSN: 1079-7114
DOI: 10.1103/PhysRevLett.123.045501
Titel-ID: cdi_osti_scitechconnect_1545422

Weiterführende Literatur

Empfehlungen zum selben Thema automatisch vorgeschlagen von bX