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Laser-induced breakdown spectroscopy thickness measurements of films thinner than ablation rate
Ist Teil von
Spectrochimica acta. Part B: Atomic spectroscopy, 2017-10, Vol.136 (C), p.34-38
Ort / Verlag
Oxford: Elsevier B.V
Erscheinungsjahr
2017
Link zum Volltext
Quelle
Elsevier ScienceDirect Journals Complete
Beschreibungen/Notizen
A new laser-induced breakdown spectroscopy (LIBS) technique is proposed to measure the thickness of films thinner than the ablation rate. The film thickness dependence of the signal intensity is used as a calibration curve. It is demonstrated that calibration curves are successfully made for thin W films and (Fe, Cr, Ni) mixed-material films produced in a magnetron sputtering device.
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•LIBS method is proposed to measure the thickness of films thinner than ablation rate.•The film thickness dependence of the signal intensity is used as a calibration curve.•Calibration curves are produced for films made of both single and multi elements.•The composition of multi-element films can be simultaneously derived.