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Details

Autor(en) / Beteiligte
Titel
Beam test results of a 16 ps timing system based on ultra-fast silicon detectors
Ist Teil von
  • Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 2017-04, Vol.850 (C), p.83-88
Ort / Verlag
Netherlands: Elsevier
Erscheinungsjahr
2017
Quelle
Alma/SFX Local Collection
Beschreibungen/Notizen
  • In this paper we report on the timing resolution obtained in a beam test with pions of 180 GeV/c momentum at CERN for the first production of 45 μm thick Ultra-Fast Silicon Detectors (UFSD). UFSD are based on the Low- Gain Avalanche Detector (LGAD) design, employing n-on-p silicon sensors with internal charge multiplication due to the presence of a thin, low-resistivity diffusion layer below the junction. The UFSD used in this test had a pad area of 1.7 mm2. The gain was measured to vary between 5 and 70 depending on the sensor bias voltage. The experimental setup included three UFSD and a fast trigger consisting of a quartz bar readout by a SiPM. The timing resolution was determined by doing Gaussian fits to the time-of-flight of the particles between one or more UFSD and the trigger counter. For a single UFSD the resolution was measured to be 34 ps for a bias voltage of 200 V, and 27 ps for a bias voltage of 230 V. For the combination of 3 UFSD the timing resolution was 20 ps for a bias voltage of 200 V, and 16 ps for a bias voltage of 230 V.
Sprache
Englisch
Identifikatoren
ISSN: 0168-9002
eISSN: 1872-9576
DOI: 10.1016/j.nima.2017.01.021
Titel-ID: cdi_osti_scitechconnect_1390332

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