Details

Autor(en) / Beteiligte

• Lazicki, A
• Rygg, J R
• Coppari, F
• Smith, R
• Fratanduono, D
• Kraus, R G
• Collins, G W
• Briggs, R
• Braun, D G
• Swift, D C
• Eggert, J H

Titel

X-Ray Diffraction of Solid Tin to 1.2 TPa

Ist Teil von

• Physical review letters, 2015-08, Vol.115 (7), p.075502-075502, Article 075502

Ort / Verlag

United States: American Physical Society

Erscheinungsjahr

2015

Quelle

American Physical Society

Beschreibungen/Notizen

• We report direct in situ measurements of the crystal structure of tin between 0.12 and 1.2 TPa, the highest stress at which a crystal structure has ever been observed. Using angle-dispersive powder x-ray diffraction, we find that dynamically compressed Sn transforms to the body-centered-cubic (bcc) structure previously identified by ambient-temperature quasistatic-compression studies and by zero-kelvin density-functional theory predictions between 0.06 and 0.16 TPa. However, we observe no evidence for the hexagonal close-packed (hcp) phase found by those studies to be stable above 0.16 TPa. Instead, our results are consistent with bcc up to 1.2 TPa. We conjecture that at high temperature bcc is stabilized relative to hcp due to differences in vibrational free energy.