Details

Autor(en) / Beteiligte

• Behrens, C
• Decker, F-J
• Ding, Y
• Dolgashev, V A
• Frisch, J
• Huang, Z
• Krejcik, P
• Loos, H
• Lutman, A
• Maxwell, T J
• Turner, J
• Wang, J
• Wang, M-H
• Welch, J
• Wu, J

Titel

Few-femtosecond time-resolved measurements of X-ray free-electron lasers

Ist Teil von

• Nature communications, 2014-04, Vol.5 (1), p.3762-3762, Article 3762

Ort / Verlag

England: Nature Publishing Group

Erscheinungsjahr

2014

Quelle

MEDLINE

Beschreibungen/Notizen

• X-ray free-electron lasers, with pulse durations ranging from a few to several hundred femtoseconds, are uniquely suited for studying atomic, molecular, chemical and biological systems. Characterizing the temporal profiles of these femtosecond X-ray pulses that vary from shot to shot is not only challenging but also important for data interpretation. Here we report the time-resolved measurements of X-ray free-electron lasers by using an X-band radiofrequency transverse deflector at the Linac Coherent Light Source. We demonstrate this method to be a simple, non-invasive technique with a large dynamic range for single-shot electron and X-ray temporal characterization. A resolution of less than 1 fs root mean square has been achieved for soft X-ray pulses. The lasing evolution along the undulator has been studied with the electron trapping being observed as the X-ray peak power approaches 100 GW.