Details

Autor(en) / Beteiligte

• Lienert, U.
• Li, S. F.
• Hefferan, C. M.
• Lind, J.
• Suter, R. M.
• Bernier, J. V.
• Barton, N. R.
• Brandes, M. C.
• Mills, M. J.
• Miller, M. P.
• Jakobsen, B.
• Pantleon, W.

Titel

High-energy diffraction microscopy at the advanced photon source

Ist Teil von

• JOM (1989), 2011-07, Vol.63 (7), p.70-77

Ort / Verlag

Boston: Springer US

Erscheinungsjahr

2011

Link zum Volltext

Quelle

SpringerLink (Online service)

Beschreibungen/Notizen

• The status of the High Energy Diffraction Microscopy (HEDM) program at the 1-ID beam line of the Advanced Photon Source is reported. HEDM applies high energy synchrotron radiation for the grain and sub-grain scale structural and mechanical characterization of polycrystalline bulk materials in situ during thermomechanical loading. Case studies demonstrate the mapping of grain boundary topology, the evaluation of stress tensors of individual grains during tensile deformation and comparison to a finite element modeling simulation, and the characterization of evolving dislocation structure. Complementary information is obtained by post mortem electron microscopy on the same sample volume previously investigated by HEDM.