Details

Autor(en) / Beteiligte

• Nellist, P. D.
• Chisholm, M. F.
• Dellby, N.
• Krivanek, O. L.
• Murfitt, M. F.
• Szilagyi, Z. S.
• Lupini, A. R.
• Borisevich, A.
• Sides, W. H.
• Pennycook, S. J.

Titel

Direct Sub-Angstrom Imaging of a Crystal Lattice

Ist Teil von

• Science (American Association for the Advancement of Science), 2004-09, Vol.305 (5691), p.1741-1741

Ort / Verlag

Washington, DC: American Association for the Advancement of Science

Erscheinungsjahr

2004

Link zum Volltext

Quelle

American Association for the Advancement of Science

Beschreibungen/Notizen

• Despite the use of electrons with wavelengths of just a few picometers, spatial resolution in a transmission electron microscope (TEM) has been limited by spherical aberration to typically around 0.15 nanometer. Individual atomic columns in a crystalline lattice can therefore only be imaged for a few low-order orientations, limiting the range of defects that can be imaged at atomic resolution. The recent development of spherical aberration correctors for transmission electron microscopy allows this limit to be overcome. We present direct images from an aberration-corrected scanning TEM that resolve a lattice in which the atomic columns are separated by less than 0.1 nanometer.