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Details

Autor(en) / Beteiligte
Titel
Room-temperature MBE deposition, thermoelectric properties, and advanced structural characterization of binary Bi2Te3 and Sb2Te3 thin films
Ist Teil von
  • Journal of alloys and compounds, 2012-04, Vol.521, p.163-173
Ort / Verlag
Kidlington: Elsevier B.V
Erscheinungsjahr
2012
Link zum Volltext
Quelle
Elsevier ScienceDirect Journals Complete
Beschreibungen/Notizen
  • [Display omitted] ► MBE deposition at room temperature and subsequent annealing for phase formation. ► This growth procedure easily yielded stoichiometric Sb2Te3 and Bi2Te3 thin films. ► Sb2Te3 films revealed favorable charge carrier density and mobility. ► Advanced characterization of texture by high-energy X-ray diffraction. ► Precise chemical analysis by calibrated EDX spectroscopy and energy-filtered TEM. Sb2Te3 and Bi2Te3 thin films were grown at room temperature on SiO2 and BaF2 substrates using molecular beam epitaxy. A layer-by-layer growth was achieved such that metallic layers of the elements with 0.2nm thickness were deposited. The layer structure in the as-deposited films was confirmed by X-ray diffraction and was seen more clearly in Sb2Te3 thin films. Subsequent annealing was done at 250°C for 2h and produced the Sb2Te3 and Bi2Te3 crystal structure as confirmed by high-energy X-ray diffraction. This preparation process is referred to as nano-alloying and it was demonstrated to yield single-phase thin films of these compounds. In the thin films a significant texture could be identified with the crystal c axis being almost parallel to the growth direction for Sb2Te3 and tilted by about 30° for Bi2Te3 thin films. In-plane transport properties were measured for the annealed films at room temperature. Both films yielded a charge carrier density of about 2.6×1019cm−3. The Sb2Te3 films were p-type, had a thermopower of +130μVK−1, and surprisingly high mobilities of 402cm2V−1s−1. The Bi2Te3 films were n-type, showed a thermopower of −153μVK−1, and yielded significantly smaller mobilities of 80cm2V−1s−1. The chemical composition and microstructure of the films were investigated by transmission electron microscopy (TEM) on cross sections of the thin films. The grain sizes were about 500nm for the Sb2Te3 and 250nm for the Bi2Te3 films. In the Bi2Te3 thin film, energy-filtered TEM allowed to image a Bi-rich grain boundary phase, several nanometers thick. This secondary phase explains the poor mobilities of the Bi2Te3 thin film. With these results the high potential of the nano-alloying deposition technique for growing films with a more complex layer architecture is demonstrated.

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