Details

Autor(en) / Beteiligte

• Rodríguez-Rodríguez, G
• Pérez-Junquera, A
• Vélez, M
• Anguita, J V
• Martín, J I
• Rubio, H
• Alameda, J M

Titel

MFM observations of domain wall creep and pinning effects in amorphous CoxSi1−x films with diluted arrays of antidots

Ist Teil von

• Journal of physics. D, Applied physics, 2007-05, Vol.40 (10), p.3051-3055

Ort / Verlag

IOP Publishing

Erscheinungsjahr

2007

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• Magnetic force microscopy (MFM) has been used to analyse the behaviour of domain walls in uniaxial amorphous CoxSi1-x films patterned with diluted arrays of antidots by electron beam lithography. The walls are found to be pinned by the antidot array when the antidot density is high enough along the easy axis. The expansion of reversed nuclei under the influence of the tip stray field has been observed in several consecutive MFM images of the same area, showing how the competition between line tension effects and pinning by the patterned holes governs the creep motion of the 180 deg walls across the array of antidots.