Details

Autor(en) / Beteiligte

• Aubret, A
• Dolique, V
• Piednoir, A
• Dujardin, C
• Kulzer, F
• Houel, J

Titel

Single CdSe/CdS colloidal nanocrystals embedded in an Ultra-Pure SiO2 matrix deposited by ion beam sputtering

Ist Teil von

• Semiconductor science and technology, 2020-03, Vol.35 (5)

Ort / Verlag

IOP Publishing

Erscheinungsjahr

2020

Quelle

Alma/SFX Local Collection

Beschreibungen/Notizen

• We report the encapsulation of high-quantum-yield CdSe/CdS colloidal nanocrystals in a smooth and ultra-pure layer of SiO2 deposited by ion beam sputtering. The optical quality of the thin silica film is comparable to the mirror substrates used in gravitational-wave detection, with a density of impurities as low as a few ppm. We show that at least 30% of the nanocrystals survive the encapsulation process under full conservation of their favorable optical properties at the single-quantum-dot level, namely a high and stable emission rate combined with a short recombination lifetime. The emission rate of the embedded nanocrystals is increased by 100% due to the higher refractive index of the SiO2 film, in accordance with an effective-medium interpretation. Our device prototype thus provides a perspective for designing large-scale, high-quality and thickness-controlled light-emitting diodes based on semiconductor nanocrystals as active components in a durable inorganic matrix.