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The decrease of crystal phonon peak intensities in Raman spectra of silicon carbide after heavy-ion irradiation is analysed in relation to band-gap shrinkage and Urbach edge slope increase arising from accumulation of lattice disorder. The discrepancy on amorphous fractions deduced from Raman spectroscopy and Rutherford backscattering-channelling spectroscopy is addressed by taking into account point-defect formation and amorphization by displacement damage. A new analysis of Raman data is provided on the basis of self-absorption of scattered light associated with damage build-up.