Details

Autor(en) / Beteiligte

• Shimozato, Kyohei
• Sato, Takashi

Titel

dGPLVM: A Nonparametric Device Model for Statistical Circuit Simulation

Ist Teil von

• 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS), 2022, p.1-6

Ort / Verlag

IEEE

Erscheinungsjahr

2022

Quelle

IEEE Electronic Library Online

Beschreibungen/Notizen

• In this study, a novel statistical device model, dGPLVM, is proposed. In dGPLVM, device variation is compactly represented using low-dimensional latent variables and temperature dependence can be incorporated. The fitting accuracy of the dGPLVM and the generated device characteristics obtained through sampling in the latent space are validated using the measurement results of commercial power MOSFETs. Verilog-A implementation of the proposed method demonstrates its practicality.