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Autor(en) / Beteiligte
Titel
5.5 A 2.1e− Temporal Noise and −105dB Parasitic Light Sensitivity Backside-Illuminated 2.3µm-Pixel Voltage-Domain Global Shutter CMOS Image Sensor Using High-Capacity DRAM Capacitor Technology
Ist Teil von
  • 2020 IEEE International Solid- State Circuits Conference - (ISSCC), 2020, p.102-104
Ort / Verlag
IEEE
Erscheinungsjahr
2020
Quelle
IEEE Electronic Library (IEL)
Beschreibungen/Notizen
  • As the automotive and AI industries are expanding rapidly, global-shutter (GS) image sensors are playing a more significant role in the perception system. More specifically, GS image sensors are required in various fields involving IR, including the face-ID in mobile devices, the driver monitoring system in automotive applications, and factory automation. GS image sensors are necessary for these applications because they can capture freeze-frame images without motion distortion due to their advantage in the pixel operation method. The simultaneous pixel exposure and in-pixel storing capability allow GS image sensors to achieve high-quality imaging, while the sequential pixel exposure and readout of rolling-shutter (RS) image sensors results in image distortion known as the jello effect. For mobile and automotive applications, a small form factor while maintaining a low parasitic light sensitivity (PLS) and low noise is crucial. In conventional backside illuminated (BSI) charge-domain GS image sensors, a light-shielding structure over the storage area must be formed in order to suppress the influence of parasitic light during the readout operation. Therefore, the introduction of such a light-shielding structure reduces the effective photodiode area, which results in a loss of full-well capacity (FWC), light sensitivity of the sensor, and pixel scalability.
Sprache
Englisch
Identifikatoren
eISSN: 2376-8606
DOI: 10.1109/ISSCC19947.2020.9063092
Titel-ID: cdi_ieee_primary_9063092

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