2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486), 2000, Vol.1, p.345-348 vol.1
2000
Volltextzugriff (PDF)
Details
- Autor(en) / Beteiligte
- Titel
- A characterization technique of high power/temperature devices using HP4275/3437 systems
- Ist Teil von
- 2000 International Semiconductor Conference. 23rd Edition. CAS 2000 Proceedings (Cat. No.00TH8486), 2000, Vol.1, p.345-348 vol.1
- Ort / Verlag
- IEEE
- Erscheinungsjahr
- 2000
- Quelle
- IEEE Xplore
- Beschreibungen/Notizen
- This paper presents ways for increasing the number of measurement techniques of a ready made system. Using this technique we develop a platform for electrical and thermal characterization of the high power/high temperature devices.
- Sprache
- Englisch
- Identifikatoren
- ISBN: 0780358856, 9780780358850DOI: 10.1109/SMICND.2000.890251Titel-ID: cdi_ieee_primary_890251
- Format
- –
- Schlagworte
- Breakdown voltage, Circuits, Current measurement, Diodes, Fluid flow measurement, Instruments, Measurement techniques, Silicon carbide, Temperature, Voltmeters