Details

Autor(en) / Beteiligte

• Mooshammer, Fabian
• Mussler, Gregor
• Grutzmacher, Detlev
• Boland, Jessica L.
• Cocker, Tyler L.
• Huber, Rupert
• Sandner, Fabian
• Huber, Markus A.
• Zizlsperger, Martin
• Weigand, Helena
• Plankl, Markus
• Weyrich, Christian
• Lanius, Martin
• Kampmeier, Jorn

Titel

Nanoscale Mid-Infrared Near-Field Tomography of Topological Insulator Surfaces

Ist Teil von

• 2019 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC), 2019, p.1-1

Ort / Verlag

IEEE

Erscheinungsjahr

2019

Quelle

IEL

Beschreibungen/Notizen

• Three-dimensional topological insulators (TIs) have become an interesting platform for future high-speed electronics. The massless Dirac fermions in topologically protected surface states (TSSs) feature a chiral spin texture, which gives rise to inherently low scattering rates [1,2]. However, an additional two-dimensional electron gas (2DEG) with finite mass at TI surfaces can coexist under ambient conditions [3] owing to band bending effects.