Details

Autor(en) / Beteiligte

• Alberucci, Alessandro
• Jisha, Chandroth P.
• Nolte, Stefan

Titel

Determining the Waveguide Profile using the Overlap Integral

Ist Teil von

• 2019 Conference on Lasers and Electro-Optics Europe & European Quantum Electronics Conference (CLEO/Europe-EQEC), 2019, p.1-1

Ort / Verlag

IEEE

Erscheinungsjahr

2019

Quelle

IEEE Electronic Library Online

Beschreibungen/Notizen

• The determination of the index profile in guiding structures is a central problem in applied photonics, ranging from optical fibers to femtosecond-written waveguides [1]. A non-destructive and relatively easy method consists in the measurement of the index profile by measuring the transmitted field [2]. From the transmitted field, the refractive index profile is computed by direct inversion of the Helmholtz equation. This technique is called near-field method. Here we present a new near-field method based upon the inversion of the overlap integral.