Details

Autor(en) / Beteiligte

• Kruskopf, Mattias
• Rigosi, Albert F.
• Panna, Alireza R.
• Patel, Dinesh K.
• Jin, Hanbyul
• Marzano, Martina
• Berilla, Michael
• Newell, David B.
• Elmquist, Randolph E.

Titel

Two-Terminal and Multi-Terminal Designs for Next-Generation Quantized Hall Resistance Standards: Contact Material and Geometry

Ist Teil von

• IEEE transactions on electron devices, 2019-09, Vol.66 (9), p.3973-3977

Ort / Verlag

United States: IEEE

Erscheinungsjahr

2019

Quelle

IEEE

Beschreibungen/Notizen

• In this paper, we show that quantum Hall resistance measurements using two terminals may be as precise as four-terminal measurements when applying superconducting split contacts. The described sample designs eliminate resistance contributions of terminals and contacts such that the size and complexity of next-generation quantized Hall resistance devices can be significantly improved.