2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), 2018, p.1-5
2018
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- Autor(en) / Beteiligte
- Titel
- CMOS image sensor for extracting depth information using pixel aperture technique
- Ist Teil von
- 2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC), 2018, p.1-5
- Ort / Verlag
- IEEE
- Erscheinungsjahr
- 2018
- Quelle
- IEEE Xplore
- Beschreibungen/Notizen
- In this paper, complementary metal oxide semiconductor (CMOS) image sensors that can extract depth information using the pixel aperture technique is presented. The pixel array of the proposed image sensor is composed of blue, red, and white pixels, as well as pixel apertures. The apertures are formed by metal pattern in the white pixels. The focused and defocused images are obtained, simultaneously, using the proposed image sensor, and are used for calculating the depth information. The proposed image sensor was designed and fabricated using the 0.11-μm CMOS image sensor process, and its performance was evaluated.
- Sprache
- Englisch
- Identifikatoren
- DOI: 10.1109/I2MTC.2018.8409654Titel-ID: cdi_ieee_primary_8409654
- Format
- –
- Schlagworte
- Active pixel sensors, aperture, Apertures, Cameras, CMOS, CMOS image sensors, depth from defocus, image sensor, Photodiodes, pixel, Three-dimensional displays