Details

Autor(en) / Beteiligte

• Peng Xinguang
• Bai Fenge
• Meng Zhaoguang

Titel

Easily testable VLSI design intelligent selection and insertion system DISIS

Ist Teil von

• 1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings (Cat. No.98EX105), 1998, p.536-539

Ort / Verlag

IEEE

Erscheinungsjahr

1998

Quelle

IEEE Electronic Library (IEL)

Beschreibungen/Notizen

• DISIS is a knowledge based intelligent system that advises the VLSI designers on selecting and inserting the best design for testability (DFT) for a particular VLSI circuit to satisfy a set of parameter requirements and design goals. The DISIS system is different from the previous approaches in three main aspects. The DFT techniques are inserted only to the critical ports identified by testability analysis. The multiple description and a new cost evaluation function are introduced to the DISIS system.