Details

Autor(en) / Beteiligte

• Eun-Hye Choi
• Artho, Cyrille
• Kitamura, Takashi
• Mizuno, Osamu
• Yamada, Akihisa

Titel

Distance-Integrated Combinatorial Testing

Ist Teil von

• 2016 IEEE 27th International Symposium on Software Reliability Engineering (ISSRE), 2016, p.93-104

Ort / Verlag

IEEE

Erscheinungsjahr

2016

Quelle

IEEE Electronic Library Online

Beschreibungen/Notizen

• This paper proposes a novel approach to combinatorial test generation, which achieves an increase of not only the number of new combinations but also the distance between test cases. We applied our distance-integrated approach to a state-of-the-art greedy algorithm for traditional combinatorial test generation by using two distance metrics, Hamming distance, and a modified chi-square distance. Experimental results using numerous benchmark models show that combinatorial test suites generated by our approach using both distance metrics can improve interaction coverage for higher interaction strengths with low computational overhead.