2014 IEEE Radiation Effects Data Workshop (REDW), 2014, p.1-5
2014
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Details
- Autor(en) / Beteiligte
- Titel
- Single-Event Characterization of the 28 nm Xilinx Kintex-7 Field-Programmable Gate Array under Heavy Ion Irradiation
- Ist Teil von
- 2014 IEEE Radiation Effects Data Workshop (REDW), 2014, p.1-5
- Ort / Verlag
- IEEE
- Erscheinungsjahr
- 2014
- Quelle
- IEEE Electronic Library Online
- Beschreibungen/Notizen
- This study examines the single-event response of the Xilinx 28 nm Kintex-7 FPGA irradiated with heavy ions. Results for single-event effects on configuration SRAM cells, user-accessible Flip-Flop cells, and BlockRAM™ memory are provided. This study also describes an unconventional single event latch-up signature observed during testing.
- Sprache
- Englisch
- Identifikatoren
- ISBN: 1479958832, 9781479958832ISSN: 2154-0519eISSN: 2154-0535DOI: 10.1109/REDW.2014.7004595Titel-ID: cdi_ieee_primary_7004595
- Format
- –
- Schlagworte
- Field programmable gate arrays, Flip-flops, Monitoring, Rails, Single event upsets, Temperature measurement, Testing