Details

Autor(en) / Beteiligte

• Zeng, W.B.
• Wei, D.Z.

Titel

Intelligent backtracking in test generation for combinational circuits

Ist Teil von

• Proceedings 1989 IEEE International Conference on Computer Design: VLSI in Computers and Processors, 1989, p.48-51

Ort / Verlag

IEEE Comput. Soc. Press

Erscheinungsjahr

1989

Quelle

IEEE Xplore

Beschreibungen/Notizen

• An intelligent backtracking algorithm for the test generation of combinational circuits is introduced. This algorithm, called INBACK, differs from PODEM and FAN in that, when a contradiction occurs, it chooses a backtracking element which is most likely to eliminate the contradiction and change its value. An efficient method of identifying such backtracking elements is established. Experiments on 5 of 10 benchmark circuits with this method show that the average backtracking times are reduced.< >