2011 12th European Conference on Radiation and Its Effects on Components and Systems, 2011, p.863-870
2011
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Details
- Autor(en) / Beteiligte
- Titel
- Compendium of TID and SEE test results for various candidate spacecraft electronics
- Ist Teil von
- 2011 12th European Conference on Radiation and Its Effects on Components and Systems, 2011, p.863-870
- Ort / Verlag
- IEEE
- Erscheinungsjahr
- 2011
- Quelle
- IEEE Electronic Library (IEL)
- Beschreibungen/Notizen
- We present data on the vulnerability of various candidate spacecraft electronics to total ionizing dose and heavy ion induced single event effects. Most of the tested devices are commercial integrated circuits, including Memories, Analog-to-Digital Converters and others.
- Sprache
- Englisch
- Identifikatoren
- ISBN: 9781457705854, 1457705850ISSN: 0379-6566DOI: 10.1109/RADECS.2011.6131318Titel-ID: cdi_ieee_primary_6131318
- Format
- –
- Schlagworte
- Component, Ions, Performance evaluation, Power supplies, Radiation, Silicon, Spacecraft, Temperature measurement, Testing, Xenon