2011 - 14th International Symposium on Electrets, 2011, p.35-36
2011
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Details
- Autor(en) / Beteiligte
- Titel
- Behind space charge distribution measurements
- Ist Teil von
- 2011 - 14th International Symposium on Electrets, 2011, p.35-36
- Ort / Verlag
- IEEE
- Erscheinungsjahr
- 2011
- Quelle
- IEEE Xplore
- Beschreibungen/Notizen
- Measuring space charge seems relatively simple, but the complexity of the sample structure and interfacial conditions may result in biased analysis. In this abstract, some clues are given to test which factor are important to check before analyzing measurements.
- Sprache
- Englisch
- Identifikatoren
- ISBN: 9781457710230, 1457710234ISSN: 2153-3253eISSN: 2153-327XDOI: 10.1109/ISE.2011.6084969Titel-ID: cdi_ieee_primary_6084969
- Format
- –
- Schlagworte
- Materials