Details

Autor(en) / Beteiligte

• Shankar, S.
• Horst, S. J.
• Saha, P.
• Howard, D. C.
• Diestelhorst, R.
• England, T. D.
• Cressler, J. D.

Titel

Wide-tuning range, amplitude-locked test signal source for self-healing, mixed-signal electronic systems

Ist Teil von

• 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting, 2011, p.29-32

Ort / Verlag

IEEE

Erscheinungsjahr

2011

Quelle

IEEE Xplore

Beschreibungen/Notizen

• An integrated wideband amplitude-locked test signal source for "self-healing" and built-in-self-test (BIST) of multiband mixed-signal system-on-a-chip solutions is demonstrated. To the authors' knowledge, this work achieves the widest reported tuning range per unit die area compared to the state-of-the-art. The signal generator spans frequencies ranging from X to K band while occupying only 0.329 mm 2 of core die area. The oscillator core is based on a differential ring topology to achieve wide tuning capability. The amplitude-locked loop consists of a variable gain amplifier (VGA), a low power peak detector, and an opamp that doubles as a loop filter. The circuits were fabricated in a commercially-available 180 nm SiGe BiCMOS platform.