Details

Autor(en) / Beteiligte

• Lin, W.-A
• Lee, C.-C
• Huang, J.-L

Titel

Sigma-delta modulation based wafer-level testing for TFT-LCD source driver ICs

Ist Teil von

• 29th VLSI Test Symposium, 2011, p.315-320

Ort / Verlag

IEEE

Erscheinungsjahr

2011

Quelle

IEEE Electronic Library Online

Beschreibungen/Notizen

• Output variation testing of TFT-LCD source driver ICs is very expensive and time-consuming due to the large amount of analog output channels and levels to measure. This paper presents a low-cost on-scribe-line BIST technique for wafer-level source driver IC testing. Based on the BIST structure and the sigma-delta modulation principle, we propose a two-stage test flow and construct a generalized test cost function to find the optimal test setup parameters.