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2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, 2010, p.1-8
2010

Details

Autor(en) / Beteiligte
Titel
Cooling microprocessors using vapor compression refrigeration
Ist Teil von
  • 2010 12th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems, 2010, p.1-8
Ort / Verlag
IEEE
Erscheinungsjahr
2010
Link zum Volltext
Quelle
IEEE
Beschreibungen/Notizen
  • Maintaining future high performance microprocessor chips within an acceptable operating temperature range (e.g. less than 85°C), is likely to involve the removal of large quantities of heat (e.g. several hundred Watts), from small areas (e.g. 1- 2 cm 2 ), necessitating very high heat fluxes. To date, heat dissipation from computer chips has generally been achieved by means of heat sinks and fans; however, alternative, more effective cooling techniques are likely to be needed in the future. Three UK universities are undertaking a 3-year collaborative project to develop a miniature vapor compression refrigeration (VCR) system, suitable for future microprocessor and electronic cooling. The design and testing of a novel porous media based evaporator heat exchanger is being undertaken by Newcastle University. Preliminary results suggest that this device should be capable of achieving the high heat fluxes required. The University of Oxford's Cryogenics Group has developed specialised oil-free compressors for low temperature cooling systems for space applications. Based on this work, a new design of compressor has been developed, which is suitable for use with miniature VCR devices. The performance of such systems is being studied by means of simulation by London South Bank University. Models developed to date include an overall miniature VCR system model, and a detailed model of the compressor. The current paper will focus on the design and construction of the compressor and the compressor model developed. The mathematical modelling approach used will be discussed, and the results from a number of simulations will be reported.
Sprache
Englisch
Identifikatoren
ISBN: 9781424453429, 1424453429
ISSN: 1087-9870
eISSN: 2577-0799
DOI: 10.1109/ITHERM.2010.5501390
Titel-ID: cdi_ieee_primary_5501390

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