Details

Autor(en) / Beteiligte

• Ballay, N.
• Baylac, B.

Titel

WCAP'' : Worst Case Analysis Program : A Tool for Statistical Circuit Simulation

Ist Teil von

• ESSDERC '88: 18th European Solid State Device Research Conference, 1988-09, Vol.49 (C4), p.c4-269-c4-273

Ort / Verlag

IEEE

Erscheinungsjahr

1988

Quelle

IEEE Electronic Library (IEL)

Beschreibungen/Notizen

• The goal of `WCAP' Program is to extract automatically first order CAD model parameter spreads directly from various histograms of classical indicators (threshold voltage, static currents, ...) usually measured on industrial parametric testers.