Details

Autor(en) / Beteiligte

• Feist, R.
• Rozeveld, S.
• Kern, B.
• D'Archangel, J.
• Yeung, S.
• Bernius, M.

Titel

Further investigation of the lifetime-limiting failure mechanisms of CIGSS-based minimodules under environmental stress

Ist Teil von

• 2009 34th IEEE Photovoltaic Specialists Conference (PVSC), 2009, p.002359-002363

Ort / Verlag

IEEE

Erscheinungsjahr

2009

Quelle

IEEE Electronic Library (IEL)

Beschreibungen/Notizen

• The lifetime-limiting failure mechanisms of CuInGaSSe (CIGSS) solar devices made by Shell Solar Industries (SSI) were investigated. In our study, SSI minimodules were exposed to dry-heat 85°C, damp-heat 85°C/85% RH and aerobic and anaerobic room temperature and 85°C water baths. After 200 hours exposure to moisture-containing environments, the average device performance decreased by more than 30% that of the initial state. The observed degradation was primarily due to losses in short circuit current density (J sc ) and fill factor (FF). The as-received device layers were relatively dense and free of voids. Interestingly, unreacted Cu-Ga particulates were found at the Mo-CIGSS interface. Corresponding with these particulates, CIS-rich defects were found within the bulk CIGSS material. Post-environmental weathering, Kirkendall-like voids were found in the Al:ZnO and CdS layers of these devices. Additionally, ToF-SIMS analysis revealed the Cu-Ga/CIS defects were enriched in Na and O. Our results indicate that in addition to moisture-induced failure of the window layers, the unreacted Cu-Ga particulates and the corresponding CIS-defects may facilitate moisture and/or oxygen-induced failure of these devices.