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Investigation of drift dynamics and injection stability of high-current electron beam with picosecond resolution
Ist Teil von
2009 IEEE Pulsed Power Conference, 2009, p.971-974
Ort / Verlag
IEEE
Erscheinungsjahr
2009
Quelle
IEEE/IET Electronic Library
Beschreibungen/Notizen
The stability of the injection of short electron beams and the dynamic processes that occur during their transport were experimentally studied. Beams of energy 200-300 keV, current 1-1500 A, and duration 0.05-3 ns with a current rise time of 30-300 ps were formed in a cold-cathode electrode gaps. For measuring beam currents special collector probes were used which ensured a picosecond resolution.