Details

Autor(en) / Beteiligte

• Gunyan, D.
• Horn, J.
• Jianjun Xu
• Root, D.E.

Titel

Nonlinear validation of arbitrary load X-parameter and measurement-based device models

Ist Teil von

• 2009 73rd ARFTG Microwave Measurement Conference, 2009, p.1-4

Ort / Verlag

IEEE

Erscheinungsjahr

2009

Link zum Volltext

• IEEE_Xplore

Quelle

IEEE/IET Electronic Library (IEL)

Beschreibungen/Notizen

• X-parameters are the mathematically correct supersets of S-parameters valid for nonlinear (and linear) components under large-signal (and small-signal) conditions. This paper compares a PHD model generated from arbitrary load-dependent measured X-parameters and a measurement-based non-quasi-static device model and validates them against tuned-load measurements. CW, IMD, and ACPR swept-power measurements are compared. The models agree on the simulated device behavior and compare well to validation measurements.