Details

Autor(en) / Beteiligte

• Wang Jiejun
• Xu Chuan-pei

Titel

Test generation for combinational circuits based on DNA computing

Ist Teil von

• 2009 9th International Conference on Electronic Measurement & Instruments, 2009, p.4-650-4-653

Ort / Verlag

IEEE

Erscheinungsjahr

2009

Quelle

IEL

Beschreibungen/Notizen

• The aim of this paper is to illustrate the automatic test generation for combinational circuits based on DNA computing. In the algorithm the chromosomes are encoded by the four bases of nucleic acid Sigma = {A,G,C,T} and the gene-class genetic manipulation is introduced to ensure the population diversity; In addition, the test set size produced by DNA chain is controlled at different stages of test generation so as to reduce the redundancy of test sets and accelerate the speed of test generation. The experimental results for benchmark circuit iscas'85 show that this algorithm can achieve high fault coverage and substantially reduce the size of test vector sets.