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2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials, 2009, p.773-776
2009

Details

Autor(en) / Beteiligte
Titel
Analysis on the structure and electrical property of PI/MWNTs films
Ist Teil von
  • 2009 IEEE 9th International Conference on the Properties and Applications of Dielectric Materials, 2009, p.773-776
Ort / Verlag
IEEE
Erscheinungsjahr
2009
Link zum Volltext
Quelle
IEEE Electronic Library (IEL)
Beschreibungen/Notizen
  • In this paper, Polyimide/mutil-walled carbon nanotube(PI/MWNTs) nanocomposites were fabricated by an in-situ polymerization process. Scanning electron microscopy(SEM) was used to analyze the microstructure of the surface and cross-section shape. The relationship between the structure of the films and the electrical property including the dielectric constant epsiv r , the dielectric loss factor tandelta and the volume resistivity was researched. The results showed that the addition of acid-modified MWNTs into a polyimide matrix led to some variations in the dielectric properties, dielectric constant increased at first then decreased with the increase of the content of MWNTs, the variation of dielectric loss is not obvious when doping content of MWNTs is lower than 1.5 wt%, with the content of MWNTs increased continuously, the dielectric loss improved significantly. As the doping content reached 11.598 wt%, the volume resistivity of PI/MWNTs films sharply decreased to 1.96 times 10 8 Omegamiddotm.
Sprache
Englisch
Identifikatoren
ISBN: 9781424443673, 1424443679
ISSN: 2160-9225
DOI: 10.1109/ICPADM.2009.5252151
Titel-ID: cdi_ieee_primary_5252151

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