2008 IEEE International Electron Devices Meeting, 2008, p.1-4
2008
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Details
- Autor(en) / Beteiligte
- Titel
- Advanced image sensor technology for pixel scaling down toward 1.0µm (Invited)
- Ist Teil von
- 2008 IEEE International Electron Devices Meeting, 2008, p.1-4
- Ort / Verlag
- IEEE
- Erscheinungsjahr
- 2008
- Quelle
- IEEE Electronic Library Online
- Beschreibungen/Notizen
- As pixel size of image sensors shrinks down rapidly, we are reaching technical barrier to get the required low light performance. In this paper, recent advanced technologies such as backside illumination, new color filter array, low F-number with extended depth of field technologies, etc. are introduced to overcome such a barrier. It is shown that the integration of these advanced sensor technologies can make pixel size shrink down toward 1.0 mum with the required performance.
- Sprache
- Englisch
- Identifikatoren
- ISBN: 9781424423774, 1424423775ISSN: 0163-1918eISSN: 2156-017XDOI: 10.1109/IEDM.2008.4796671Titel-ID: cdi_ieee_primary_4796671
- Format
- –
- Schlagworte
- Bismuth, CMOS image sensors, CMOS technology, Image sensors, Lighting, Moon, Optical crosstalk, Optical sensors, Pixel, Sensor phenomena and characterization