2008 IEEE Radiation Effects Data Workshop, 2008, p.124-130
2008
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Details
- Autor(en) / Beteiligte
- Titel
- Total Ionizing Dose and Dose Rate Effects in Candidate Spacecraft Electronic Devices
- Ist Teil von
- 2008 IEEE Radiation Effects Data Workshop, 2008, p.124-130
- Ort / Verlag
- IEEE
- Erscheinungsjahr
- 2008
- Quelle
- IEEE Xplore
- Beschreibungen/Notizen
- Total dose tests of common devices reveal unexpected dose rate sensitivity. Devices from the same vendor procured to SMD versus military specifications exhibit substantially different dose rate effects. Behavior and critical parameters are compared and discussed.
- Sprache
- Englisch
- Identifikatoren
- ISBN: 142442545X, 9781424425457ISSN: 2154-0519eISSN: 2154-0535DOI: 10.1109/REDW.2008.29Titel-ID: cdi_ieee_primary_4638627
- Format
- –
- Schlagworte
- Operational amplifiers, Performance evaluation, Radiation effects, Radiation hardening, Sensitivity, Silicon, Space vehicles