Details

Autor(en) / Beteiligte

• Yamaguchi, T.J.
• Hou, H.X.
• Takayama, K.
• Armstrong, D.
• Ishida, M.
• Soma, M.

Titel

An FFT-based jitter separation method for high-frequency jitter testing with a 10x reduction in test time

Ist Teil von

• 2007 IEEE International Test Conference, 2007, p.1-8

Ort / Verlag

IEEE

Erscheinungsjahr

2007

Quelle

IEEE/IET Electronic Library (IEL)

Beschreibungen/Notizen

• This paper proposes an FFT-based method that separates random jitter from deterministic jitter in clock and data patterns, with a 10X reduction in test time. The method has been verified experimentally on a 2.5 Gbps clock pattern & 7-stage PRBS, and gives results that are comparable to existing methods.