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Image Complexity and Feature Extraction for Steganalysis of LSB Matching Steganography
Ist Teil von
18th International Conference on Pattern Recognition (ICPR'06), 2006, Vol.2, p.267-270
Ort / Verlag
IEEE
Erscheinungsjahr
2006
Quelle
IEEE
Beschreibungen/Notizen
In this paper, we present a scheme for steganalysis of LSB matching steganography based on feature extraction and pattern recognition techniques. Shape parameter of generalized Gaussian distribution (GGD) in the wavelet domain is introduced to measure image complexity. Several statistical pattern recognition algorithms are applied to train and classify the feature sets. Comparison of our method and others indicates our method is highly competitive. It is highly efficient for color image steganalysis. It is also efficient for grayscale steganalysis in the low image complexity domain